INTERNATIONAL PATENT: TMEIC CORPORATION, 株式会社ＴＭＥＩＣ FILES APPLICATION FOR "APPARATUS AND TEMPERATURE ABNORMALITY DETECTION METHOD"

GENEVA, Nov. 24 -- TMEIC CORPORATION (3-1-1, Kyobashi, Chuo-ku, Tokyo1040031), 株式会社ＴＭＥＩＣ (東京都中央区京橋三丁目１番１号) filed a patent application (PCT/JP2024/017612) for "APPARATUS AND TEMPERATURE ABNORMALITY DETECTION METHOD" on May 13, 2024. With publication no. WO/2025/238679, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HAYASHI Naoya (c/o TMEIC CORPORATION, 3-1-...