INTERNATIONAL PATENT: TECHIK INSTRUMENT (SHANGHAI) CO., LTD, 上海太易检测技术股份有限公司 FILES APPLICATION FOR "STRONG/WEAK-FIELD-BASED FOREIGN OBJECT DETECTION METHOD AND APPARATUS FOR METAL DETECTOR AND STORAGE MEDIUM"

GENEVA, Feb. 1 -- TECHIK INSTRUMENT (SHANGHAI) CO., LTD (Room 1038, Floor 2, Ji Building, No. 555 Dongchuan Road, Minhang DistrictShanghai 201108), 上海太易检测技术股份有限公司 (中国上海市闵行区东川路555号己楼2层1038室) filed a patent application (PCT/CN2024/119010) for "STRONG/WEAK-FIELD-BASED FOREIGN OBJECT DETECTION METHOD AND APPARATUS FOR METAL DETECTOR, AND STORAGE MEDIUM" on Sep 14, 2024. With publication no. WO/2026/020571, the details related to the patent application was published on Jan 29, 2026.

Notably, the patent application was submitted under the ...