GENEVA, Nov. 23 -- TECHIK INSTRUMENT (SHANGHAI) CO., LTD (Room 1038, Floor 2, Ji Building, No.555 Dongchuan Road, Minhang DistrictShanghai 201108), 上海太易检测技术股份有限公司 (中国上海市闵行区东川路555号己楼2层1038室) filed a patent application (PCT/CN2024/118723) for "INTEGRATED X-RAY DEVICE" on Sep 13, 2024. With publication no. WO/2025/236500, the details related to the patent application was published on Nov 20, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intel...