INTERNATIONAL PATENT: TECHIK INSTRUMENT (SHANGHAI) CO., LTD, 上海太易检测技术股份有限公司 FILES APPLICATION FOR "FOREIGN-OBJECT DETECTION METHOD AND APPARATUS BASED ON DUAL-FREQUENCY SIGNAL"

GENEVA, Dec. 7 -- TECHIK INSTRUMENT (SHANGHAI) CO., LTD (Room 1038, Floor 2, Ji Building, No.555 Dongchuan Road,Minhang District, Shanghai 201108), 上海太易检测技术股份有限公司 (中国上海市闵行区东川路555号己楼2层1038室) filed a patent application (PCT/CN2024/101564) for "FOREIGN-OBJECT DETECTION METHOD AND APPARATUS BASED ON DUAL-FREQUENCY SIGNAL" on Jun 26, 2024. With publication no. WO/2025/245948, the details related to the patent application was published on Dec 04, 2025.

Notably, the patent application was submitted under the International Patent Classificat...