INTERNATIONAL PATENT: SUZHOU HYC TECHNOLOGY CO., LTD, 苏州华兴源创科技股份有限公司 FILES APPLICATION FOR "HARDWARE DEFECT DETECTION METHOD, APPARATUS AND DEVICE"

GENEVA, March 8 -- SUZHOU HYC TECHNOLOGY CO., LTD (No.8, Qingqiu Lane, Suzhou Industrial ParkSuzhou, Jiangsu 215000), 苏州华兴源创科技股份有限公司 (中国江苏省苏州市苏州工业园区青丘巷8号) filed a patent application (PCT/CN2023/133004) for "HARDWARE DEFECT DETECTION METHOD, APPARATUS AND DEVICE" on Nov 21, 2023. With publication no. WO/2025/043898, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the W...