INTERNATIONAL PATENT: STANLEY ELECTRIC CO., LTD., スタンレー電気株式会社, NATIONAL UNIVERSITY CORPORATION CHIBA UNIVERSITY, 国立大学法人千葉大学 FILES APPLICATION FOR "DEVICE DEVIATION CALCULATION METHOD, OBJECT MEASUREMENT METHOD AND OBSERVATION DEVICE"

Posted On: 2026-01-13

GENEVA, Jan. 13 -- STANLEY ELECTRIC CO., LTD. (2-9-13, Nakameguro, Meguro-ku, Tokyo1538636), スタンレー電気株式会社 (東京都目黒区中目黒２丁目９番１３号), NATIONAL UNIVERSITY CORPORATION CHIBA UNIVERSITY (1-33, Yayoicho, Inage-ku, Chiba-shi, Chiba2638522), 国立大学法人千葉大学 (千葉県千葉市稲毛区弥生町１番３３号) filed a patent application (PCT/JP2025/024075) for "DEVICE DEVIATION CALCULATION METHOD, OBJECT MEASUREMEN...

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इस लेख के रीप्रिंट को खरीदने या इस प्रकाशन का पूरा फ़ीड प्राप्त करने के लिए, कृपया हमे संपर्क करें.

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INTERNATIONAL PATENT: STANLEY ELECTRIC CO., LTD., スタンレー電気株式会社, NATIONAL UNIVERSITY CORPORATION CHIBA UNIVERSITY, 国立大学法人千葉大学 FILES APPLICATION FOR "DEVICE DEVIATION CALCULATION METHOD, OBJECT MEASUREMENT METHOD AND OBSERVATION DEVICE"