INTERNATIONAL PATENT: SHIM, NAK HOON, 심낙훈, CHOI, IK CHANG, 최익창 FILES APPLICATION FOR "SYSTEM FOR SELF-DIAGNOSIS OF CONCRETE UTILITY POLE VERTICAL CRACKS"

GENEVA, July 29 -- SHIM, Nak Hoon (#6507-502,270 Wiryesunhwan-ro,Hanam-si,Gyeonggi-do 13013), 심낙훈 (경기도하남시위례순환로 270, 6507동 502호), CHOI, IK Chang (33 Dwiran-gil,Iksan-siJeonbuk-do 54569), 최익창 (전북특별자치도익산시뒤란길 33) filed a patent application (PCT/KR2024/010669) for "SYSTEM FOR SELF-DIAGNOSIS OF CONCRETE UTILITY POLE VERTICAL CRACKS" on Jul 24, 2024. With publication no. WO/2025/154888, the details related to the patent application was published on Jul 24, 2025.

Notably, the patent application was submitted under the Internati...