INTERNATIONAL PATENT: SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY CHINESE ACADEMY OF SCIENCES, 中国科学院深圳先进技术研究院 FILES APPLICATION FOR "METALENS-BASED NEAR-SURFACE DEFECT SUPER-RESOLUTION IMAGING SYSTEM AND IMAGING METHOD"

GENEVA, April 5 -- SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY CHINESE ACADEMY OF SCIENCES (1068, Xueyuan Avenue, Shenzhen University Town, Nanshan DistrictShenzhen, Guangdong 518055), 中国科学院深圳先进技术研究院 (中国广东省深圳市南山区深圳大学城学苑大道1068号) filed a patent application (PCT/CN2023/137603) for "METALENS-BASED NEAR-SURFACE DEFECT SUPER-RESOLUTION IMAGING SYSTEM AND IMAGING METHOD" on Dec 08, 2023. With publication no. WO/2025/065889, the details related to the patent application was published on Apr 03, 2025.

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