GENEVA, May 10 -- SHANGHAI ADVANCED INSPECTION TECHNOLOGY CO., LTD. (C-1 Block, North Lai Fang Road, Jiuting TownSongjiang District, Shanghai 201615), 上海超群检测科技股份有限公司 (中国上海市松江区九亭镇涞坊路北侧C-1地块) filed a patent application (PCT/CN2024/115309) for "HIGH-ENERGY MICRO-FOCUS X-RAY TUBE" on Aug 28, 2024. With publication no. WO/2025/092191, the details related to the patent application was published on May 08, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is m...