GENEVA, May 27 -- SAPEON KOREA INC. (10F, 6 Hwangsaeul-ro 258beon-gilBundang-gu, Seongnam-siGyeonggi-do 13595), 주식회사 사피온코리아 (경기도성남시 분당구황새울로258번길 6, 10층) filed a patent application (PCT/KR2024/001683) for "METHOD AND APPARATUS FOR OPTIMIZING RANDOM TEST OF DUT" on Feb 06, 2024. With publication no. WO/2025/105592, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIP...