INTERNATIONAL PATENT: SANTEC HOLDINGS CORPORATION, ＳＡＮＴＥＣ ＨＯＬＤＩＮＧＳ株式会社 FILES APPLICATION FOR "MEASUREMENT SYSTEM AND MEASUREMENT METHOD"

GENEVA, Aug. 18 -- SANTEC HOLDINGS CORPORATION (5823 Ohkusa-Nenjozaka, Komaki-shi, Aichi4850802), ｓａｎｔｅｃ　Ｈｏｌｄｉｎｇｓ株式会社 (愛知県小牧市大草年上坂５８２３番地) filed a patent application (PCT/JP2024/036323) for "MEASUREMENT SYSTEM AND MEASUREMENT METHOD" on Oct 10, 2024. With publication no. WO/2025/169540, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the Wor...