INTERNATIONAL PATENT: RIKEN, 国立研究開発法人理化学研究所 FILES APPLICATION FOR "CHARGED PARTICLE BEAM SENSOR AND MEASUREMENT DATA PROCESSING METHOD THEREFOR"

GENEVA, Feb. 17 -- RIKEN (2-1, Hirosawa, Wako-shi Saitama3510198), 国立研究開発法人理化学研究所 (埼玉県和光市広沢２番１号) filed a patent application (PCT/JP2024/025183) for "CHARGED PARTICLE BEAM SENSOR AND MEASUREMENT DATA PROCESSING METHOD THEREFOR" on Jul 11, 2024. With publication no. WO/2025/033094, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ADACHI, Taihei (...