INTERNATIONAL PATENT: RIGAKU CORPORATION, 株式会社リガク FILES APPLICATION FOR "X-RAY OPTICAL DEVICE AND X-RAY PHOTOELECTRON SPECTROMETER"

GENEVA, Dec. 1 -- RIGAKU CORPORATION (3-9-12, Matsubara-cho, Akishima-shi, Tokyo1968666), 株式会社リガク (東京都昭島市松原町三丁目９番１２号) filed a patent application (PCT/JP2025/018155) for "X-RAY OPTICAL DEVICE AND X-RAY PHOTOELECTRON SPECTROMETER" on May 20, 2025. With publication no. WO/2025/244009, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JIANG Licai (c/o Rigaku Inno...