INTERNATIONAL PATENT: RHEINISCH-WESTFALISCHE TECHNISCHE HOCHSCHULE AACHEN, ABGEKURZT RWTH AACHEN, KORPERSCHAFT DES OFFENTLICHEN RECHTS FILES APPLICATION FOR "METHOD AND DEVICE FOR THE IN-SYSTEM CALIBRATION OF GAMMA RADIATION DETECTORS OF A POSITRON EMISSION TOMOGRAPH"

GENEVA, Sept. 8 -- RHEINISCH-WESTFALISCHE TECHNISCHE HOCHSCHULE AACHEN, ABGEKURZT RWTH AACHEN, KORPERSCHAFT DES OFFENTLICHEN RECHTS (Templergraben 5552062 Aachen) filed a patent application (PCT/EP2025/055551) for "METHOD AND DEVICE FOR THE IN-SYSTEM CALIBRATION OF GAMMA RADIATION DETECTORS OF A POSITRON EMISSION TOMOGRAPH" on Feb 28, 2025. With publication no. WO/2025/181346, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KUHL, Yannick (Rutscher StraBe 652072 Aachen), SCHULZ, Volkmar (Elly-Heuss-Knapp-Str. 752146 Wursel...