INTERNATIONAL PATENT: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION, 睿励科学仪器（上海）有限公司 FILES APPLICATION FOR "DEFECT DETECTION METHOD, DEFECT DETECTION APPARATUS AND STORAGE MEDIUM"

Posted On: 2025-07-07

GENEVA, July 7 -- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION (6 Blog, No. 68 Huatuo Rd., China (Shanghai) Pilot Free Trade ZonePudong New Area, Shanghai 201203), 睿励科学仪器（上海）有限公司 (中国上海市浦东新区中国（上海）自由贸易试验区华佗路68号6幢) filed a patent application (PCT/CN2024/116961) for "DEFECT DETECTION METHOD, DEFECT DETECTION APPARATUS, AND STORAGE MEDIUM" on Sep 04, 2024. With publication no. WO/2025/139026, the details related to the patent application was published on...

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INTERNATIONAL PATENT: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION, 睿励科学仪器（上海）有限公司 FILES APPLICATION FOR "DEFECT DETECTION METHOD, DEFECT DETECTION APPARATUS AND STORAGE MEDIUM"