GENEVA, May 5 -- OMRON CORPORATION (801, Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku, Kyoto-shi, Kyoto6008530), オムロン株式会社 (京都府京都市下京区塩小路通堀川東入南不動堂町８０１番地) filed a patent application (PCT/JP2024/035241) for "X-RAY IMAGING SYSTEM AND X-RAY INSPECTION DEVICE" on Oct 02, 2024. With publication no. WO/2025/088999, the details related to the patent application was published on May 01, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) s...