INTERNATIONAL PATENT: NUFLARE TECHNOLOGY, INC., 株式会社ニューフレアテクノロジー FILES APPLICATION FOR "PATTERN INSPECTION DEVICE, FOCAL POINT POSITION ADJUSTMENT METHOD AND PATTERN INSPECTION METHOD"

GENEVA, April 19 -- NUFLARE TECHNOLOGY, INC. (8-1, Shinsugita-cho, Isogo-ku, Yokohama-shi, Kanagawa2358522), 株式会社ニューフレアテクノロジー (神奈川県横浜市磯子区新杉田町８番１) filed a patent application (PCT/JP2024/035365) for "PATTERN INSPECTION DEVICE, FOCAL POINT POSITION ADJUSTMENT METHOD, AND PATTERN INSPECTION METHOD" on Oct 03, 2024. With publication no. WO/2025/079487, the details related to the patent application was published on Apr 17, 2025.

Notably, the patent application was submitted under the International Patent Classification...