GENEVA, June 2 -- NUFLARE TECHNOLOGY, INC. (8-1, Shinsugita-cho, Isogo-ku, Yokohama-shi, Kanagawa2358522), 株式会社ニューフレアテクノロジー (神奈川県横浜市磯子区新杉田町8番1) filed a patent application (PCT/JP2024/025090) for "METHOD FOR DIAGNOSING ABNORMALITY OF BLANKING APERTURE ARRAY SUBSTRATE AND MULTI-BEAM DRAWING METHOD" on Jul 11, 2024. With publication no. WO/2025/109799, the details related to the patent application was published on May 30, 2025.
Notably, the patent application was submitted under the International Patent Classificati...