INTERNATIONAL PATENT: NUCTECH COMPANY LIMITED, 同方威视技术股份有限公司, TSINGHUA UNIVERSITY, 清华大学 FILES APPLICATION FOR "CALIBRATION METHOD AND CALIBRATION SYSTEM FOR CALIBRATING SCANNING IMAGING DEVICE"

Posted On: 2025-07-07

GENEVA, July 7 -- NUCTECH COMPANY LIMITED (2nd Floor, Block A, Tong Fang Building, ShuangqingluHaidian District, Beijing 100084), 同方威视技术股份有限公司 (中国北京市海淀区双清路同方大厦A座2层), TSINGHUA UNIVERSITY (No. 1, Tsinghua YuanHaidian District, Beijing 100084), 清华大学 (中国北京市海淀区清华园1号) filed a patent application (PCT/CN2024/141121) for "CALIBRATION METHOD AND CALIBRATION SYSTEM FOR CALIBRATING SCANNING IMAGING DEVICE" on Dec 20, 2024. With publication no....

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INTERNATIONAL PATENT: NUCTECH COMPANY LIMITED, 同方威视技术股份有限公司, TSINGHUA UNIVERSITY, 清华大学 FILES APPLICATION FOR "CALIBRATION METHOD AND CALIBRATION SYSTEM FOR CALIBRATING SCANNING IMAGING DEVICE"