INTERNATIONAL PATENT: NIKON CORPORATION, 株式会社ニコン FILES APPLICATION FOR "OPTICAL DEVICE FOR INSPECTION, DEFECT INSPECTION DEVICE, IRRADIATION OPTICAL SYSTEM AND INSPECTION METHOD"

GENEVA, March 17 -- NIKON CORPORATION (15-3, Konan 2-chome, Minato-ku, Tokyo1086290), 株式会社ニコン (東京都港区港南二丁目１５番３号) filed a patent application (PCT/JP2023/032456) for "OPTICAL DEVICE FOR INSPECTION, DEFECT INSPECTION DEVICE, IRRADIATION OPTICAL SYSTEM, AND INSPECTION METHOD" on Sep 06, 2023. With publication no. WO/2025/052563, the details related to the patent application was published on Mar 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s):...