INTERNATIONAL PATENT: NATIONAL INSTITUTE OF METROLOGY. CHINA, 中国计量科学研究院 FILES APPLICATION FOR "DETECTION METHOD AND SYSTEM BASED ON FUSION OF VARIOUS SPECTRAL DATA AND MEDIUM AND APPARATUS"

GENEVA, Dec. 8 -- NATIONAL INSTITUTE OF METROLOGY. CHINA (No.18 North Third Ring East Road, Chaoyang DistrictBeijing 100029), 中国计量科学研究院 (中国北京市朝阳区北三环东路18号) filed a patent application (PCT/CN2025/076911) for "DETECTION METHOD AND SYSTEM BASED ON FUSION OF VARIOUS SPECTRAL DATA, AND MEDIUM AND APPARATUS" on Feb 12, 2025. With publication no. WO/2025/246443, the details related to the patent application was published on Dec 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Prope...