INTERNATIONAL PATENT: MZ OPTOELECTRONIC TECHNOLOGY (SHANGHAI) CO., LTD., 魅杰光电科技（上海）有限公司 FILES APPLICATION FOR "OPTICAL FLOW-BASED OVERLAY ERROR MEASUREMENT METHOD, APPARATUS AND SYSTEM AND STORAGE MEDIUM"

Posted On: 2025-11-23

GENEVA, Nov. 23 -- MZ OPTOELECTRONIC TECHNOLOGY (SHANGHAI) CO., LTD. (Building 1 And Building 2, No. 333, Ocean Road 1, Lingang New Area, China (Shanghai) Pilot Free Trade ZonePudong New Area, Shanghai 201306), 魅杰光电科技（上海）有限公司 (中国上海市浦东新区中国(上海)自由贸易试验区临港新片区海洋一路333号1号楼、2号楼) filed a patent application (PCT/CN2025/080226) for "OPTICAL FLOW-BASED OVERLAY ERROR MEASUREMENT METHOD, APPARATUS, AND SYSTEM, AND STO...

Click here to read full article from source

To read the full article or to get the complete feed from this publication, please Contact Us.

Exclusive

Category

Source

Publication

Location

INTERNATIONAL PATENT: MZ OPTOELECTRONIC TECHNOLOGY (SHANGHAI) CO., LTD., 魅杰光电科技（上海）有限公司 FILES APPLICATION FOR "OPTICAL FLOW-BASED OVERLAY ERROR MEASUREMENT METHOD, APPARATUS AND SYSTEM AND STORAGE MEDIUM"

Exclusive

Category

Source

Publication

Location

INTERNATIONAL PATENT: MZ OPTOELECTRONIC TECHNOLOGY (SHANGHAI) CO., LTD., 魅杰光电科技（上海 ）有限公司 FILES APPLICATION FOR "OPTICAL FLOW-BASED OVERLAY ERROR MEASUREMENT METHOD, APPARATUS AND SYSTEM AND STORAGE MEDIUM"

INTERNATIONAL PATENT: MZ OPTOELECTRONIC TECHNOLOGY (SHANGHAI) CO., LTD., 魅杰光电科技（上海）有限公司 FILES APPLICATION FOR "OPTICAL FLOW-BASED OVERLAY ERROR MEASUREMENT METHOD, APPARATUS AND SYSTEM AND STORAGE MEDIUM"