INTERNATIONAL PATENT: MITUTOYO CORPORATION, 株式会社ミツトヨ FILES APPLICATION FOR "MEASUREMENT INFORMATION MANAGEMENT DEVICE, MEASUREMENT PROGRAM, MEASUREMENT METHOD AND MEASUREMENT SYSTEM"

GENEVA, Feb. 17 -- MITUTOYO CORPORATION (20-1, Sakado 1-chome, Takatsu-ku, Kawasaki-shi, Kanagawa2138533), 株式会社ミツトヨ (神奈川県川崎市高津区坂戸１丁目２０番１号) filed a patent application (PCT/JP2024/024738) for "MEASUREMENT INFORMATION MANAGEMENT DEVICE, MEASUREMENT PROGRAM, MEASUREMENT METHOD, AND MEASUREMENT SYSTEM" on Jul 09, 2024. With publication no. WO/2025/033066, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed ...