INTERNATIONAL PATENT: MITSUBISHI ELECTRIC R&D CENTRE EUROPE BV, MITSUBISHI ELECTRIC CORPORATION FILES APPLICATION FOR "DEVICE FOR ESTIMATING JUNCTION TEMPERATURE OF A POWER SEMICONDUCTOR AND ASSOCIATED METHOD FOR MONITORING SUCH JUNCTION TEMPERATURE"

GENEVA, Jan. 27 -- MITSUBISHI ELECTRIC R&D CENTRE EUROPE BV (Capronilaan 34 SCHIPHOL RIJK AMSTERDAM1119NS), MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310) filed a patent application (PCT/JP2025/080025) for "DEVICE FOR ESTIMATING JUNCTION TEMPERATURE OF A POWER SEMICONDUCTOR AND ASSOCIATED METHOD FOR MONITORING SUCH JUNCTION TEMPERATURE" on Feb 04, 2025. With publication no. WO/2026/018932, the details related to the patent application was published on Jan 22, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): QUEMENER Vincent (35708 RENNES CEDEX 7), DEGRENNE...