GENEVA, Sept. 16 -- MINEBEA POWER SEMICONDUCTOR DEVICE INC. (2-2, Omika-cho 5-chome, Hitachi-shi, Ibaraki3191221), ミネベアパワーデバイス株式会社 (茨城県日立市大みか町五丁目２番２号) filed a patent application (PCT/JP2025/004436) for "ELECTRONIC COMPONENT INSPECTION METHOD AND ELECTRONIC COMPONENT INSPECTION DEVICE" on Feb 10, 2025. With publication no. WO/2025/187334, the details related to the patent application was published on Sep 11, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, wh...