INTERNATIONAL PATENT: KONICA MINOLTA, INC., コニカミノルタ株式会社 FILES APPLICATION FOR "OPTICAL CHARACTERISTIC MEASUREMENT DEVICE"

GENEVA, July 29 -- KONICA MINOLTA, INC. (2-7-2, Marunouchi, Chiyoda-ku, Tokyo1007015), コニカミノルタ株式会社 (東京都千代田区丸の内二丁目７番２号) filed a patent application (PCT/JP2024/035909) for "OPTICAL CHARACTERISTIC MEASUREMENT DEVICE" on Oct 08, 2024. With publication no. WO/2025/154340, the details related to the patent application was published on Jul 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): YANASE Shinji (...