GENEVA, July 29 -- KABUSHIKI KAISHA TOSHIBA (1-1, Shibaura 1-chome, Minato-ku, Tokyo1050023), 株式会社 東芝 (東京都港区芝浦一丁目１番１号) filed a patent application (PCT/JP2024/040035) for "X-RAY THICKNESS GAUGE" on Nov 11, 2024. With publication no. WO/2025/154373, the details related to the patent application was published on Jul 24, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): HORIKOSHI Takahiro (c/o TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORPORATION, 72-3...