INTERNATIONAL PATENT: KABUSHIKI KAISHA NIHON MICRONICS, 株式会社日本マイクロニクス FILES APPLICATION FOR "PROBE AND ELECTRICAL CONNECTION DEVICE"

GENEVA, Aug. 11 -- KABUSHIKI KAISHA NIHON MICRONICS (6-8, Kichijojihoncho 2-chome, Musashino-shi, Tokyo1808508), 株式会社日本マイクロニクス (東京都武蔵野市吉祥寺本町２丁目６番８号) filed a patent application (PCT/JP2025/002031) for "PROBE AND ELECTRICAL CONNECTION DEVICE" on Jan 23, 2025. With publication no. WO/2025/164494, the details related to the patent application was published on Aug 07, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Prop...