INTERNATIONAL PATENT: JIANGNAN UNIVERSITY, 江南大学, 58TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION, 中国电子科技集团公司第五十八研究所 FILES APPLICATION FOR "CHIP DEFECT DETECTION METHOD AND SYSTEM"

GENEVA, July 7 -- JIANGNAN UNIVERSITY (No.1800, Lihu Avenue, Binhu DistrictWuxi, Jiangsu 214200), 江南大学 (中国江苏省无锡市滨湖区蠡湖大道1800号), 58TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (No.5, Huihe Road, Binhu Dist.,Wuxi, Jiangsu 214000), 中国电子科技集团公司第五十八研究所 (中国江苏省无锡市滨湖区惠河路5号) filed a patent application (PCT/CN2024/128016) for "CHIP DEFECT DETECTION METHOD AND SYSTEM" o...