GENEVA, July 20 -- JFE STEEL CORPORATION (2-3, Uchisaiwai-cho 2-chome, Chiyoda-ku, Tokyo1000011), JFEスチール株式会社 (東京都千代田区内幸町二丁目2番3号) filed a patent application (PCT/JP2024/030833) for "QUALITY DEFECT DIAGNOSTIC DEVICE AND QUALITY DEFECT DIAGNOSTIC METHOD" on Aug 29, 2024. With publication no. WO/2025/150222, the details related to the patent application was published on Jul 17, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organizatio...