GENEVA, Dec. 16 -- JFE STEEL CORPORATION (2-3, Uchisaiwai-cho 2-chome, Chiyoda-ku, Tokyo1000011), ＪＦＥスチール株式会社 (東京都千代田区内幸町二丁目２番３号) filed a patent application (PCT/JP2025/015475) for "FILM THICKNESS DEVIATION MEASURING METHOD, FILM THICKNESS DEVIATION MEASURING DEVICE, FILM MANUFACTURING METHOD, AND FILM MANUFACTURING DEVICE" on Apr 21, 2025. With publication no. WO/2025/253798, the details related to the patent application was published on Dec 11, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC...