INTERNATIONAL PATENT: JEONG, KYUNG HWAN, 정경환 FILES APPLICATION FOR "APPARATUS AND METHOD FOR REAL-TIME MEASUREMENT OF THIN FILM DEPOSITION THICKNESS"

GENEVA, Jan. 6 -- JEONG, Kyung Hwan (1633-306, 76 Dongtangiheung-ro 353beon-gilHwaseong-siGyeonggi-do 18480), 정경환 (경기도화성시동탄기흥로353번길 76, 1633동 306호) filed a patent application (PCT/KR2025/008042) for "APPARATUS AND METHOD FOR REAL-TIME MEASUREMENT OF THIN FILM DEPOSITION THICKNESS" on Jun 12, 2025. With publication no. WO/2026/005345, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JEONG, Kyung Hwan...