GENEVA, Aug. 17 -- INSTITUTE OF SEMICONDUCTORS, CAS (35 A Qinghua East RoadHaidian District, Beijing 100083), 中国科学院半导体研究所 (中国北京市海淀区清华东路甲35号) filed a patent application (PCT/CN2024/077103) for "APPARATUS AND METHOD FOR TESTING FAR-FIELD BEAM QUALITY OF LASER DEVICE" on Feb 09, 2024. With publication no. WO/2025/166809, the details related to the patent application was published on Aug 14, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO)...