INTERNATIONAL PATENT: INSTITUTE OF SCIENCE TOKYO, 国立大学法人東京科学大学 FILES APPLICATION FOR "SENSOR, MEASUREMENT SYSTEM AND MEASUREMENT METHOD"

GENEVA, May 13 -- INSTITUTE OF SCIENCE TOKYO (2-12-1, Ookayama, Meguro-ku, Tokyo1528550), 国立大学法人東京科学大学 (東京都目黒区大岡山二丁目１２番１号) filed a patent application (PCT/JP2024/038540) for "SENSOR, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD" on Oct 29, 2024. With publication no. WO/2025/094944, the details related to the patent application was published on May 08, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor...