INTERNATIONAL PATENT: IHI CORPORATION, 株式会社ＩＨＩ FILES APPLICATION FOR "INSPECTION DEVICE FOR INSPECTING INNER SURFACE OF HOLLOW SHAFT"

GENEVA, Nov. 24 -- IHI CORPORATION (1-1, Toyosu 3-chome, Koto-ku, Tokyo1358710), 株式会社ＩＨＩ (東京都江東区豊洲三丁目１番１号) filed a patent application (PCT/JP2025/004746) for "INSPECTION DEVICE FOR INSPECTING INNER SURFACE OF HOLLOW SHAFT" on Feb 13, 2025. With publication no. WO/2025/238951, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WATANABE Hiroki (c/o IHI Corporation, 1-1, Toyos...