INTERNATIONAL PATENT: HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY, 华中科技大学 FILES APPLICATION FOR "MEASUREMENT APPARATUS AND METHOD FOR MEASURING DEFORMATION AND SURFACE MICROSTRUCTURE OF STACKED SHEET"

GENEVA, Aug. 3 -- HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (No.1037, Luoyu Road, Hongshan DistrictWuhan, Hubei 430074), 华中科技大学 (中国湖北省武汉市洪山区珞喻路1037号) filed a patent application (PCT/CN2024/079873) for "MEASUREMENT APPARATUS AND METHOD FOR MEASURING DEFORMATION AND SURFACE MICROSTRUCTURE OF STACKED SHEET" on Mar 04, 2024. With publication no. WO/2025/156365, the details related to the patent application was published on Jul 31, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Org...