INTERNATIONAL PATENT: HORIBA, LTD., 株式会社堀場製作所 FILES APPLICATION FOR "MEASUREMENT PROBE, MEASUREMENT PROBE UNIT, MEASUREMENT DEVICE AND MEASUREMENT METHOD"

GENEVA, July 8 -- HORIBA, LTD. (2, Miyanohigashi-cho, Kisshoin, Minami-ku, Kyoto-shi, Kyoto6018510), 株式会社堀場製作所 (京都府京都市南区吉祥院宮の東町２番地) filed a patent application (PCT/JP2024/044569) for "MEASUREMENT PROBE, MEASUREMENT PROBE UNIT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD" on Dec 17, 2024. With publication no. WO/2025/142627, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property ...