INTERNATIONAL PATENT: HORIBA, LTD., 株式会社堀場製作所, HORIBA ADVANCED TECHNO, CO., LTD., 株式会社堀場アドバンスドテクノ FILES APPLICATION FOR "ANALYSIS DEVICE, SPECIMEN EVALUATION SYSTEM AND ANALYSIS METHOD"

Posted On: 2025-03-17

GENEVA, March 17 -- HORIBA, LTD. (2, Miyanohigashi-cho, Kisshoin, Minami-ku, Kyoto-shi, Kyoto6018510), 株式会社堀場製作所 (京都府京都市南区吉祥院宮の東町２番地), HORIBA ADVANCED TECHNO, CO., LTD. (2, Miyanohigashi-cho, Kisshoin, Minami-ku, Kyoto-shi, Kyoto6018551), 株式会社堀場アドバンスドテクノ (京都府京都市南区吉祥院宮の東町２番地) filed a patent application (PCT/JP2024/031162) for "AN...

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INTERNATIONAL PATENT: HORIBA, LTD., 株式会社堀場製作所, HORIBA ADVANCED TECHNO, CO., LTD., 株式会社堀場アドバンスドテクノ FILES APPLICATION FOR "ANALYSIS DEVICE, SPECIMEN EVALUATION SYSTEM AND ANALYSIS METHOD"