INTERNATIONAL PATENT: HITACHI HIGH-TECH SCIENCE CORPORATION, 株式会社日立ハイテクサイエンス FILES APPLICATION FOR "PARTICLE MEASUREMENT DEVICE, PARTICLE MEASUREMENT METHOD AND REFLECTANCE REFERENCE SAMPLE"

GENEVA, April 7 -- HITACHI HIGH-TECH SCIENCE CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056411), 株式会社日立ハイテクサイエンス (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/017863) for "PARTICLE MEASUREMENT DEVICE, PARTICLE MEASUREMENT METHOD, AND REFLECTANCE REFERENCE SAMPLE" on May 14, 2024. With publication no. WO/2025/069544, the details related to the patent application was published on Apr 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which i...