INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "SPECTROMETRY DEVICE AND SPECTROMETRY METHOD"

GENEVA, July 2 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/035000) for "SPECTROMETRY DEVICE AND SPECTROMETRY METHOD" on Sep 30, 2024. With publication no. WO/2025/134466, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ZHANG Kaifeng (c...