GENEVA, July 2 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/036446) for "SPECIMEN INSPECTION AUTOMATION SYSTEM AND METHOD FOR PREDICTING AVAILABLE TIME SLOT IN SPECIMEN INSPECTION AUTOMATION SYSTEM" on Oct 11, 2024. With publication no. WO/2025/134496, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by th...