GENEVA, Oct. 19 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/013751) for "SPECIMEN CONVEYANCE DEVICE, SPECIMEN ANALYSIS SYSTEM, AND SPECIMEN PRETREATMENT DEVICE" on Apr 04, 2025. With publication no. WO/2025/216184, the details related to the patent application was published on Oct 16, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organiz...