GENEVA, July 8 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2023/046974) for "METHOD FOR DETERMINING PLASMA FRACTIONATION CONDITIONS, PLASMA FRACTIONATION DEVICE, AND DNA EXTRACTION DEVICE EQUIPPED WITH SAME" on Dec 27, 2023. With publication no. WO/2025/141779, the details related to the patent application was published on Jul 03, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed ...