INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "ION BEAM DEVICE AND CHARGED PARTICLE BEAM ADJUSTMENT METHOD"

GENEVA, March 3 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2023/030529) for "ION BEAM DEVICE AND CHARGED PARTICLE BEAM ADJUSTMENT METHOD" on Aug 24, 2023. With publication no. WO/2025/041336, the details related to the patent application was published on Feb 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s):...