INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "DIMENSION MEASUREMENT DEVICE, DIMENSION MEASUREMENT METHOD AND DIMENSION MEASUREMENT SYSTEM"

GENEVA, March 31 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2023/034044) for "DIMENSION MEASUREMENT DEVICE, DIMENSION MEASUREMENT METHOD, AND DIMENSION MEASUREMENT SYSTEM" on Sep 20, 2023. With publication no. WO/2025/062517, the details related to the patent application was published on Mar 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property ...