INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD"

GENEVA, Dec. 30 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/022638) for "CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD" on Jun 21, 2024. With publication no. WO/2025/262940, the details related to the patent application was published on Dec 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ...