GENEVA, Feb. 10 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/008235) for "BEAM MONITORING METHOD FOR PARTICLE BEAM THERAPY SYSTEM, BEAM MONITORING PROGRAM, INFORMATION PROCESSING SYSTEM, AND PARTICLE BEAM SYSTEM" on Mar 05, 2024. With publication no. WO/2025/027917, the details related to the patent application was published on Feb 06, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is...