GENEVA, Dec. 22 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目17番1号) filed a patent application (PCT/JP2025/015736) for "AUTOMATED ANALYSIS DEVICE AND METHOD OF ASSESSING FOR CARRYOVER IN AUTOMATED ANALYSIS DEVICE" on Apr 23, 2025. With publication no. WO/2025/258240, the details related to the patent application was published on Dec 18, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property O...