INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク, KINKI UNIVERSITY, 学校法人近畿大学 FILES APPLICATION FOR "GENETIC TEST METHOD AND GENETIC TEST SYSTEM"

Posted On: 2025-08-11

GENEVA, Aug. 11 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号), KINKI UNIVERSITY (3-4-1, Kowakae, Higashiosaka City, Osaka5778502), 学校法人近畿大学 (大阪府東大阪市小若江３丁目４番１号) filed a patent application (PCT/JP2024/046454) for "GENETIC TEST METHOD AND GENETIC TEST SYSTEM" on Dec 27, 2024. With publication no. WO/2025/164199, the details r...

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INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク, KINKI UNIVERSITY, 学校法人近畿大学 FILES APPLICATION FOR "GENETIC TEST METHOD AND GENETIC TEST SYSTEM"