INTERNATIONAL PATENT: HAIGUANG INTEGRATED CIRCUIT DESIGN (BEIJING) CO., LTD., 海光集成电路设计（北京）有限公司 FILES APPLICATION FOR "METHOD AND APPARATUS FOR PERFORMING SCAN CHAIN TEST ON CHIP, ELECTRONIC DEVICE AND STORAGE MEDIUM"

Posted On: 2025-05-16

GENEVA, May 16 -- HAIGUANG INTEGRATED CIRCUIT DESIGN (BEIJING) CO., LTD. (501, Floor 5, Block C, Building 27, Phase 1Zhongguancun Software Park, 8 Dongbeiwang West RoadHaidian DistrictBeijing 100193), 海光集成电路设计（北京）有限公司 (中国北京市海淀区东北旺西路8号中关村软件园一期27号楼C座5层501) filed a patent application (PCT/CN2024/097170) for "METHOD AND APPARATUS FOR PERFORMING SCAN CHAIN TEST ON CHIP, ELECTRONIC DEVICE, AND STORAGE MEDIUM" on Jun 04, 2024. With publication no. WO/2025/097...

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INTERNATIONAL PATENT: HAIGUANG INTEGRATED CIRCUIT DESIGN (BEIJING) CO., LTD., 海光集成电路设计（北京）有限公司 FILES APPLICATION FOR "METHOD AND APPARATUS FOR PERFORMING SCAN CHAIN TEST ON CHIP, ELECTRONIC DEVICE AND STORAGE MEDIUM"